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Alfa Chemistry is able to provide colloidal defect characterization services. Introducing defects into colloidal crystals has important implications for their applications. We are able to detect various defects inside colloidal crystals generated by the step-by-step self-assembly of colloidal spheres according to research needs. Alfa Chemistry uses techniques such as electron backscatter diffraction, high-resolution transmission electron microscopy to test and analyze colloidal materials, providing you with comprehensive analysis results.
Defect states in colloidal crystals can affect the energy transfer between the crystal and the environment, further affecting their applications. Alfa Chemistry can use analytical techniques to obtain information about these defects. Our methods include but are not limited to:
EBSD is a technique derived from Scanning Electron Microscopy (SEM). By placing a fixed electron beam at a selected sampling point on the surface of the sample, crystallographic information such as grain orientation, grain orientation distribution (micro-texture), and orientation relationship of the sample can be obtained. As a surface analysis method, EBSD can quantitatively describe the regional microstructure in terms of directional components.
Fig.1 Typical view of EBSD hardware inside microscope chamber.[2]
HRTEM can use light and dark fringes to represent the interplanar spacing and can be used to analyze crystal structure and lattice defects in various advanced materials at atomic resolution. It can be used to characterize structures such as point defects, stacking faults, dislocations, and precipitate grain boundaries.
Using the TSL technique in parallel with other measurements can provide information on the electronic level of material defects.
Fig.2 Schematic representation of a typical TSL measuring system.[3]
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